The Tektronix TekExpress® LVDS (Low Voltage Differential Signaling) solution (Option 5/6-DBLVDS or LVDSTX) offers a complete physical layer measurement and debug solution for transmitter conformance and characterization of various variants of LVDS. The automated solution works with Tektronix 5/6 Series MSO and MSO/DPO70000C oscilloscopes and provides an easy way to characterize the electrical and timing measurements of LVDS signals.
The application is used to test LVDS data ranging from 100 Mbps to 6 Gbps, based on the standard under test.
|Fully automated Tx solutions: Complete automation of 30+ tests on multiple LVDS variants|
|Multiple LVDS standards: Measurements with debug capability on multiple LVDS variants supported|
|Configurable test, test settings, and test limits: Select a set of tests relevant to a given specification, use the settings for accurate results, and measure them against the configured limits value|
|Automatic mask: Automatic mask generation for a given data rate, signal levels, and mask shape|
|Generic clock recovery configuration: Fully configurable clock recovery options for all embedded clock LVDS standards|
|Reference level and filter file selection: Configurable reference level and filter settings for video standards|
|Multi-run support: The application supports multiple runs of tests to characterize the Device Under Test|
|TekExpress remote API - SCPI: The application can be remotely controlled by scripts using SCPI commands|
|Multiple report formats: Reports can be generated in CSV, MHT, and PDF format|
|Works on MSO/DPO70000C Series and 5/6 Series MSO: Supports 5/6 Series and MSO/DPO70000C oscilloscopes over all bandwidths|