Tektronix P7313SMA Differential Probe

Tektronix continues to demonstrate its proven leadership in differential probing with a significant addition to our Differential SMA Probe Family. Differential SMA Probes are designed for measuring differential signals in a 50 Ω signaling environment, providing the ability to convert from a differential SMA signal path to a single oscilloscope input channel. Many of today’s high-speed serial data standards employ differential signaling on multiple lanes that are challenging to measure simultaneously on a single oscilloscope. The Tektronix Differential SMA Probes provide the ability to measure a high-speed differential signal on each channel of a multiple-channel oscilloscope. The right oscilloscope can simultaneously acquire up to four high-speed differential signals with the use of four differential SMA probes. As an added benefit, the SMA inputs on the probes connect to high-quality 50 Ω terminations that offer industry-leading return loss, a critical specification that is very important in compliance testing as frequencies increase.