Semiconductor materials used in power electronics are transitioning from silicon to wide bandgap semiconductors such as silicon carbide (SiC) and gallium nitride (GaN) due to their superior performance in automotive and industrial applications. However, minimizing switch losses continues to be a major challenge for power device engineers. These designs must be rigorously measured to ensure compliance.
Double Pulse Testing is the standard method for measuring the switching parameters of MOSFETs or IGBT power devices. Historically this has been a time-consuming process to set up the double pulse test since function generators do not have a built-in way configure and set up the test.
But now, the Tektronix AFG31000 arbitrary function generator has a built-in software application that enables double pulse testing right from the touchscreen interface of the instrument dramatically simplifying the process for engineers.