Keithley ACS Basic Edition Automated Characterization Suite

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4 uker leveringstid
Produktnummer: ACS

Optimized for parametric testing of component and discrete (packaged) semiconductor devices, ACS Basic Edition maximizes the productivity of technicians and engineers in research and development. The versatile architecture of this software allows it to meet the wide ranging and ever changing rquirements of semiconductor device testing. It supports all of Keithley's source and measure instrument products in any combination, including Series 2600A and 2400 SourceMeter® instruments and the Model 237 SMU.

Designed for packaged devices (MOSFETs, BJTs, IGBTs, diodes, resistors, etc.)
Rich set of test libraries for fast and easy test setup and execution without programming
Built-in data analysis tools for quick analysis of parametric data
Supports Keithley's Series 2600A and 2400 SourceMeter® instruments and Model 237 SMU
FREE optional off-line version for developing test setups on a different PC