keithley_4200A
keithley_4200A
4200A_SCS-Front_Drama_Lrg
4200A_SCS-Front_Drama_Lrg
keithley_4200A_02
keithley_4200A_02
CVIV-MultiSwitch_RtAngle_5in
CVIV-MultiSwitch_RtAngle_5in
keithley_4200A_04
keithley_4200A_04
4200A-wProbeSystm_AppEn2_4in
4200A-wProbeSystm_AppEn2_4in

Keithley 4200A-SCS Parameter Analyzer

Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.
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4 uker leveringstid
Produktnummer: 4200A-SCS
BESKRIVELSE

See your innovations come to life. The 4200A-SCS is a customizable and fully-integrated parameter analyzer that provides synchronized insight into current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterization. The highest performance parameter analyzer, the 4200A-SCS accelerates semiconductor, materials, and process development.

The 4200A-SCS ClariusTM GUI-based Software provides clear, uncompromised measurement and analysis capability. Furnished with embedded measurement expertise and hundreds of ready-to-use application tests, Clarius Software enables you to dig deeper into your research with speed and confidence.

The 4200A-SCS Parameter Analyzer is completely customizable and fully upgradable, so you can add the instruments you need now – or later. With the 4200A-SCS Parameter Analyzer, making connections to your bold discoveries has never been easier.

SPESIFIKASJONER
Ready-to-use, modifiable application tests, projects and devices that reduce test development time
Industry’s first instrument with built-in measurement videos from world-wide Application engineers, in four languages, to reduce learning curve
Pin to pad contact check ensures reliable measurements
Multiple measurement functions
Data display, analysis and arithmetic functions<br><br>
<strong>Typical Applications</strong>
MOSFET, BJT Transistors
Materials Characterization
Non-volatile Memory Devices
Resistivity & Hall Effect Measurements
NBTI/PBTI
III-V Devices
Failure Analysis
Nanoscale Devices
Diodes and pn Junctions
Solar Cells
Sensors
MEMS Devices
Electrochemistry
LED and OLED
DOKUMENTASJON