keithley_4200A
keithley_4200A
4200A_SCS-Front_Drama_Lrg
4200A_SCS-Front_Drama_Lrg
keithley_4200A_02
keithley_4200A_02
CVIV-MultiSwitch_RtAngle_5in
CVIV-MultiSwitch_RtAngle_5in
keithley_4200A_04
keithley_4200A_04
4200A-wProbeSystm_AppEn2_4in
4200A-wProbeSystm_AppEn2_4in

Keithley 4200A-SCS Parameter Analyzer

Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.
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4 uker leveringstid
Produktnummer: 4200A-SCS
BESKRIVELSE

See your innovations come to life. The 4200A-SCS is a customizable and fully-integrated parameter analyzer that provides synchronized insight into current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterization. The highest performance parameter analyzer, the 4200A-SCS accelerates semiconductor, materials, and process development.

The 4200A-SCS ClariusTM GUI-based Software provides clear, uncompromised measurement and analysis capability. Furnished with embedded measurement expertise and hundreds of ready-to-use application tests, Clarius Software enables you to dig deeper into your research with speed and confidence.

The 4200A-SCS Parameter Analyzer is completely customizable and fully upgradable, so you can add the instruments you need now – or later. With the 4200A-SCS Parameter Analyzer, making connections to your bold discoveries has never been easier.

SPESIFIKASJONER
Ready-to-use, modifiable application tests, projects and devices that reduce test development time
Industry’s first instrument with built-in measurement videos from world-wide Application engineers, in four languages, to reduce learning curve
Pin to pad contact check ensures reliable measurements
Multiple measurement functions
Data display, analysis and arithmetic functions
Typical Applications
MOSFET, BJT Transistors
Materials Characterization
Non-volatile Memory Devices
Resistivity & Hall Effect Measurements
NBTI/PBTI
III-V Devices
Failure Analysis
Nanoscale Devices
Diodes and pn Junctions
Solar Cells
Sensors
MEMS Devices
Electrochemistry
LED and OLED
DOKUMENTASJON