2470_3QV (2)_2500_2500
2470_3QV (2)_2500_2500
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2470_Rear_2500_2500
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2470_Probe_Station_2500_2500
2470_AFG31000_Oscilloscope_2500_2500
2470_AFG31000_Oscilloscope_2500_2500
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Keithley 2470 20W SourceMeter SMU Instrument

1100V, 1A, 20W SOURCEMETER SMU INSTRUMENT

NOK 99 400,- (eks. mva.)

The 2470 High Voltage SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier. With its 1100 V and 10 fA capability, the 2470 is optimized for characterizing and testing high voltage, low leakage devices, materials, and modules, such as silicon carbide (SiC), gallium nitride (GaN), power MOSFETs, transient suppression devices, circuit protection devices, power modules, batteries, and much more.
Produktnummer: 2470
BESKRIVELSE

The 2470 High Voltage SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier. With its 1100 V and 10 fA capability, the 2470 is optimized for characterizing and testing high voltage, low leakage devices, materials, and modules, such as silicon carbide (SiC), gallium nitride (GaN), power MOSFETs, transient suppression devices, circuit protection devices, power modules, batteries, and much more. These new capabilities, combined with Keithley’s decades of expertise in developing high precision, high-accuracy SMU instruments, make the 2470 a “go-to instrument” for high-voltage source and low-current measurement applications in the lab and in the test rack.

SPESIFIKASJONER
Wide coverage up to 1100 V / 1 A DC 20 W max.
10 fA measure resolution
0.012% basic measure accuracy with 6½-digit resolution
Five-inch, high resolution capacitive touch screen GUI
Source and sink (4-quadrant) operation
SCPI and TSP® scripting programming modes
TSP-Link for multi-channel I-V testing
Front panel input banana jacks; rear panel high-voltage input triaxial connections
Built-in context-sensitive help
Front-panel USB 2.0 memory I/O port for transferring data, test scripts, and test configurations
DOKUMENTASJON